TITLE: ATOMIC FORCE MICROSCOPY FILES ASSOCIATED TO FIGURE SI5.
This dataset is referred to the images acquired with the Atomic Force Microscopy employed in this work. This folder contains the original files obtained from the instrument before and after the scratching on glass covered with Indium Tin oxide substrate.
Files with extension .ibw can be opened with open software Gwyddion and they contain all the recorded signals: Height, amplitude, phase and Zsensor.  
The files indicated with label "prescr" are referred to the image acquired before scratching whereas the files indicated with "poscr" are referred to the picture obtained after scratching. 
The folder also contains the picture, saved with .tif extension, obtained from the analysis of the .ibw files. The files without extension contains the scratching profile along the X axis and they have two columns: the X column is referred to the distance, expressed in um, of the analysed profile and the Y axes is expressed as nm and it indicates the depth of the scratching.  
